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Sandbox Physics

E32 · Coherent scanning and angular collection

STEM Detectors: Phase and Column Contrast

Why can changing the collection angles make the same atomic column bright or dark? Each angular region receives a different combination of electron waves. Inside the transmitted disc, their interference can make a column darker or reverse its contrast when focus changes. High-angle channels can show stronger peaks at heavier columns, but an intensity ratio also depends on the specimen and imaging conditions.

Compare bright field and annular channels formed from the same coherent scan. Change focus, thickness or lattice strain, and compare the measured intensities of light and heavy columns.

Interactive modelSTEM Detectors: Phase and Column Contrast
Selected virtual detector counts—\text{—}
Light-column deficit relative to blank—\text{—}
Light / blank difference SNR—\text{—}
Heavy / light measured mean ratio—\text{—}
More measurements and target
Selected sampled primary outcome total—\text{—}
Simulated counts beyond 250 mrad—\text{—}
Simulated removed-electron counts—\text{—}
Selected-point transmitted fraction—\text{—}
Empirical-model assumed probe FWHM—\text{—}
Signed contrast in separate audit regions—\text{—}
Pooled ROI difference SNR—\text{—}
ROI 2 / ROI 1 mean count ratio—\text{—}
Expected incident dose per scan pixel—\text{—}
Experiment target—\text{—}
Calculated half-energy probe diameter—\text{—}

Physics tutorial

STEM Detectors: Phase and Column Contrast

BackgroundA scanning probe carries phase through the specimen. Different parts of its diffraction pattern can turn the same column into a dark dip or a bright peak.

Why it mattersLight columns can leave a small but measurable intensity change inside the transmitted disc. Focus and thickness help decide its sign, so a column intensity needs its imaging conditions.

Start with the essentials

Focus question
Why can changing the collection angles make the same atomic column bright or dark?
One-sentence intuition
A collection angle selects interfering waves as well as a number of electrons.

Core mathematical model

Probe and phase grating

P(q)=A(q)e−iπλΔf∣q∣2ψR(r)=F−1[P](r−R)T(r)=eiσtV(r)\begin{aligned}P(\mathbf q)&=A(\mathbf q)e^{-i\pi\lambda\Delta f|\mathbf q|^2}\\\psi_{\mathbf R}(\mathbf r)&=\mathcal F^{-1}[P](\mathbf r-\mathbf R)\\T(\mathbf r)&=e^{i\sigma tV(\mathbf r)}\end{aligned}

The circular pupil is normalized to unit probability. Positive defocus uses the phase sign written here. Potential is in volts, slab thickness in nanometres and the interaction parameter in radians per volt nanometre.

Counts from one coherent diffraction record

μR,q=Ne∣F[TψR]∣2NA(R)=∑q∈ACR,q\begin{aligned}\mu_{\mathbf R,\mathbf q}&=N_e|\mathcal F[T\psi_{\mathbf R}]|^2\\N_{\mathcal A}(\mathbf R)&=\sum_{\mathbf q\in\mathcal A}C_{\mathbf R,\mathbf q}\end{aligned}

At each known scan position, Fourier-pixel intensities form a count record. Every virtual image integrates a mask on that same record; a mask includes its lower edge and excludes its upper edge.

Light-column deficit and counting uncertainty

CL=N‾B−N‾LN‾BσΔ2=∑BNnB2+∑LNnL2SL=∣N‾B−N‾L∣σΔ\begin{aligned}C_L&=\frac{\overline N_B-\overline N_L}{\overline N_B}\\\sigma_\Delta^2&=\frac{\sum_BN}{n_B^2}+\frac{\sum_LN}{n_L^2}\\S_L&=\frac{|\overline N_B-\overline N_L|}{\sigma_\Delta}\end{aligned}

The supplied light-column and nearby blank regions are disjoint. The difference uncertainty assumes independent count statistics; it is not a calibrated confidence interval or a composition estimate.

Real and reciprocal coordinates under strain

Lx=L0(1+εx)qx,m=m/Lxθx≃λqx\begin{aligned}L_x&=L_0(1+\varepsilon_x)\\q_{x,m}&=m/L_x\\\theta_x&\simeq\lambda q_x\end{aligned}

Strain changes the physical field width, column spacing and horizontal diffraction-angle sampling. The image uses the corresponding physical aspect ratio.

Common difficulties

When a ratio can identify atoms

Typical misconceptionThe heavy-to-light count ratio is a universal atomic-number ruler.

Better mental modelThat ratio depends on the potential model, thickness, focus, probe and detector angles. This task reports the measured ratio for known regions and its statistical context. The coherent branch omits the thermal diffuse scattering and channeling needed for quantitative interpretation of many real STEM images. The coherent branch is a fictional periodic phase grating at 200 keV. A 0.64 nm square cell contains two heavier columns and two lighter columns; assigned Gaussian potentials have width 0.015 nm and amplitudes proportional to an atomic-number proxy raised to 0.6. A normalized circular pupil forms the probe, with signed defocus phase. A single projected slab multiplies that probe before a unitary Fourier transform. There is no propagation between slices, channeling, thermal diffuse scattering, absorption, inelastic scattering or beam damage, so its high-angle channel is an elastic teaching example. A 32 by 32 scan records a 64 by 64 diffraction array at each point. Horizontal strain stretches the real-space period and changes reciprocal sampling consistently. Counts use a fixed seed, with a Gaussian approximation at high means. All virtual channels reuse those stored pixels; overlapping masks have correlated counts. Their color ranges are labelled separately. Known column regions and a nearby blank are supplied for conditional intensity and counting-noise comparisons, not elemental identification. The apparatus shows a representative axial point, with independently enlarged specimen and hardware. Its specimen color marks the prescribed projected potential. Empirical mode retains the earlier isotropic transport and Gaussian-probe example; its collection labels describe angle selection. No real material, instrument resolution or quantitative ABF/HAADF composition calibration is claimed.

Run the experiment

  1. 01

    Find the light columns

    Start with the ABF light-column preset. Compare the selected channel with the high-angle image and read the light-to-blank difference.

    What to observe: Both species give dark regions in this ABF example. In the high-angle elastic channel, their peaks have different strengths.
  2. 02

    Reverse the phase contrast

    Choose the phase-reversal preset, then move defocus and thickness.

    What to observe: A light column can become brighter than the nearby blank even though its assigned species stays the same.
  3. 03

    Select electrons from the same record

    Drag the collector edge or move the collection angles. Expand the diffraction pixels and the other virtual images.

    What to observe: Changing a virtual mask preserves the recorded Fourier pixels and their total count. Different masks can overlap.
  4. 04

    Stretch the crystal and reduce counts

    Compare the strain and low-exposure presets, then reset.

    What to observe: Strain changes both the specimen width and reciprocal sampling. Low exposure can leave the light-column difference statistically unresolved.
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