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Sandbox Physics

E57 · Photoelectron microscopy

Momentum Microscopy: Time-of-Flight Cube

Record transverse momentum and arrival time in one exposure. Convert stored timestamps into energy, inspect slices of the same data cube, and tune drift energy and pulse rate. Detect pulse overlap, clipped time windows, calibration errors and single-hit pile-up.

Interactive modelMomentum Microscopy: Time-of-Flight Cube
Pulse identification—\text{—}
Total recorded cube events—\text{—}
Events in inspected energy slice—\text{—}
Single-hit loss within open gate—\text{—}
Momentum-aperture transmission—\text{—}
Expected distribution in open gate—\text{—}
Pulse period—\text{—}
Latest modeled arrival with timing margin—\text{—}
Local energy FWHM estimate—\text{—}
Accepted rate before counting losses—\text{—}
Recorded event rate—\text{—}
Counts represented in converted energy range—\text{—}
Experiment target—\text{—}

Physics tutorial

Parallel acquisition still has a clock and a count limit

BackgroundThe cathode lens projects a momentum image. A time-resolving collector adds arrival time, so each event contains two momentum coordinates and a clock value.

Why it mattersRetardation lengthens the flight and improves energy sensitivity, but needs enough time between photon pulses. Single-hit counting favors early events when pulses are crowded.

Start with the essentials

Focus question
When does parallel counting distort the band map?
One-sentence intuition
Calibrate and slice the same recorded cube. Pulse overlap, gate clipping and pile-up are different failures and require different controls.

Core mathematical model

Field-free electron flight

tf=Lme2eEdt_f=L\sqrt{\frac{m_e}{2eE_d}}

Energy is in eV and flight length is in metres. The displayed clock also contains a trigger offset.

Timestamp energy conversion

E=meL22e(t−t0)2−EdE=\frac{m_e L^2}{2e(t-t_0)^2}-E_d

Time is in seconds here. The supplied trigger offset changes conversion without changing counts.

Single-hit saturation

η=1−e−μgμg\eta=\frac{1-e^{-\mu_g}}{\mu_g}

The earliest admitted event is recorded; the mean admitted count in the open gate controls efficiency.

Common difficulties

A recorded fraction needs a model

Typical misconceptionAll emitted electrons become recorded events.

Better mental modelCalibrate and slice the same recorded cube. Pulse overlap, gate clipping and pile-up are different failures and require different controls.

Run the experiment

  1. 01

    Reduce pile-up

    Compare clean pulses with crowded pulses at the same mean incoming rate.

    What to observe: The single-hit detector loses more electrons and distorts the arrival spectrum when each pulse is crowded.
  2. 02

    Slice the acquired cube

    Change the energy slice, momentum row and supplied trigger offset.

    What to observe: Converted views change while the raw arrival histogram and collector totals remain identical.
  3. 03

    Check the flight window

    Try overlapping pulse periods, close the gate early, then restore the clean preset and check the target.

    What to observe: Overlap rejects an ambiguous acquisition; early gating removes late low-energy events.