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E35 · Energy-filtered imaging

EFTEM: Energy Windows & Elemental Maps

Does a bright energy-filtered pixel mean more carbon? Not necessarily. An image taken just above the carbon edge also contains background from other energy losses. The three-window method uses two images below the edge to estimate that background pixel by pixel, then subtracts it. Even so, the map depends on noise, where the windows sit, how well the images line up, specimen thickness and the background model.

Slide an energy slit across the spectrum of the transmitted electrons. Record two images below the carbon edge and one above it, fit a power-law background at every pixel, and compare the signed net map with a jump-ratio map and a separately recorded relative-thickness map. Then correct a drifting acquisition from its recorded frames, without swapping in the known specimen.

Interactive modelEFTEM: Energy Windows & Elemental Maps
Net map / blurred known amount correlation—\text{—}
Valid fitted overlap0 %0\,\mathrm{\%}
Assumed spatial blur · standard deviation0 nm0\,\mathrm{nm}
Five-image protocol dose—\text{—}
More measurements and target
Background window geometry—\text{—}
Processed output—\text{—}
Experiment target—\text{—}

Physics tutorial

A filtered image is a measurement, not an element label

BackgroundAn energy filter lets through transmitted electrons whose loss falls in a chosen range, and the image relay keeps the position on the specimen each one came from. An image taken above the edge contains both the core signal and a background.

Why it mattersThick regions and drift can look bright even where there is no more of the element. A map you can defend needs recorded background windows and valid processing.

Start with the essentials

Focus question
Does a bright energy-filtered pixel mean more carbon?
One-sentence intuition
The three-window method fits and subtracts the background at every pixel, so what remains depends on noise, window placement, image alignment and the background model.

Core mathematical model

The slit integrates the spectrum at each pixel

Ck(r)=Ninc∫Ek−ΔE/2Ek+ΔE/2S(r,E) dEC_k(\mathbf r)=N_{\mathrm{inc}}\int_{E_k-\Delta E/2}^{E_k+\Delta E/2}S(\mathbf r,E)\,\mathrm dE

Counts are drawn from this integral after the stated spatial blur and frame shift are applied. The live slit preview is an exposure separate from the three-image mapping protocol.

Fit the whole window, not its center value

B(E)=A(E/284 eV)−rWk(r)=∫Ek−ΔE/2Ek+ΔE/2(E/284 eV)−r dEC1/C2=W1(r)/W2(r)\begin{aligned}B(E)&=A(E/284\,\mathrm{eV})^{-r}\\W_k(r)&=\int_{E_k-\Delta E/2}^{E_k+\Delta E/2}(E/284\,\mathrm{eV})^{-r}\,\mathrm dE\\C_1/C_2&=W_1(r)/W_2(r)\end{aligned}

At each pixel the fit finds the exponent and amplitude from the recorded pre-edge counts. A fit is marked invalid if the exponent falls outside the assumed range from zero up to eight. Edge signal leaking into a pre-edge window breaks the background assumption.

Subtract the background and keep the sign of the residual

Cnet=Cpost−AWpost(r),Rjump=CpostC2C_{\mathrm{net}}=C_{\mathrm{post}}-A W_{\mathrm{post}}(r),\qquad R_{\mathrm{jump}}=\frac{C_{\mathrm{post}}}{C_2}

The net signal and the jump ratio mean different things, and neither gives atomic concentration by itself: cross sections, thickness and plural scattering all matter. Negative residuals are kept instead of being clipped to make the image look cleaner.

Thickness from a separate pair of low-loss counts

μapp(r)=ln⁡C0(r)+Closs(r)C0(r)\mu_{\mathrm{app}}(\mathbf r)=\ln\frac{C_0(\mathbf r)+C_{\mathrm{loss}}(\mathbf r)}{C_0(\mathbf r)}

The zero-loss and all-loss counts are assumed to have the same collection efficiency. Spatial blur and counting noise prevent an exact pixel-by-pixel result. This relative-thickness image is separate from the carbon map.

Common difficulties

A jump ratio is not concentration

Typical misconceptionA brighter pixel in the ratio map always has a larger atomic fraction.

Better mental modelThe denominator also depends on background and thickness. Quantitative analysis calibrated with cross sections is beyond this model.

Run the experiment

  1. 01

    Move the slit

    Compare losses near zero, 16 eV and 300 eV. Watch which representative paths pass the slit and how the detector changes.

    What to observe: The detector always shows the energy window you selected. The three-window mapping protocol uses its own fixed window above the edge.
  2. 02

    Break a background assumption

    Choose Pre-edge contamination, then restore a safe second window. Widen the slit and inspect both boundaries.

    What to observe: The check rejects windows that overlap or include the carbon edge. A map that looks plausible is not enough.
  3. 03

    Correct the drifting frames

    Choose Uncorrected drift, then enable known-frame alignment. Compare the raw frames, net profile, correlation and coverage.

    What to observe: The raw images do not change. Processing resamples them and masks the edges that no longer overlap; the counting noise stays.
  4. 04

    Compare the outputs and finish

    Try the jump-ratio and relative-thickness presets, then obtain a valid signed map with correlation at least 0.95 and coverage at least 75 percent.

    What to observe: More exposure improves counting precision but raises the dose of the protocol. The thickness and ratio maps cannot replace background subtraction for the element.
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