Skip to main content
Sandbox Physics

Optics 097 · Waveguides, structured light, and modern optics

Surface Plasmon Resonance Lab

How does surface plasmon resonance detect a change in a sample's refractive index? The sample changes the angle at which reflected light becomes darkest. In a prism coupled to a thin metal film, p-polarized light can excite a strong electric field at the metal–sample surface and increase metal absorption. Changing the sample index shifts this resonance. Film thickness and loss also affect the dip, so quantitative sensing needs calibration.

Tune a Kretschmann prism coupler and a finite metal film. Compare p and s polarization, follow the reflection dip as the analyte index changes, inspect the complex electric field and integrate the same field’s Joule loss.

Interactive modelSurface Plasmon Resonance Lab
Reflected normal power RR0.500.50
Power absorbed in metal AA50%50\%
Analyte-side electric enhancement FEF_E0.00π0.00\pi
Model regimevalid model regime\text{valid model regime}

Physics tutorial

Audit the physics of Surface Plasmon Resonance Lab

BackgroundA prism supplies a larger tangential wavevector, kx=npk0sin⁡θk_x=n_p k_0\sin\theta. A thin metal film lets the incident field couple to a wave concentrated near the metal–sample interface. The source and collector indicate internal directions inside an ideally matched semicylindrical coupler.

Why it mattersHow does surface plasmon resonance detect a change in a sample's refractive index?

Start with the essentials

Focus question
How does surface plasmon resonance detect a change in a sample's refractive index?
One-sentence intuition
At every angle, R+T+A=1R+T+A=1. Above the sample light line there is no normal transmitted power. Near a p-polarized resonance the reflected beam dims and Joule heating in the metal increases; a stronger surface electric field is not an extra source of energy.

Core mathematical model

Finite-film reflection

qj=εj−np2sin⁡2θr=r01+r12e2ik0q1d1+r01r12e2ik0q1drij=gi−gjgi+gj,gj={qjsqj/εjp\begin{gathered}q_j=\sqrt{\varepsilon_j-n_p^2\sin^2\theta}\\r=\frac{r_{01}+r_{12}e^{2ik_0q_1d}}{1+r_{01}r_{12}e^{2ik_0q_1d}}\\r_{ij}=\frac{g_i-g_j}{g_i+g_j},\quad g_j=\begin{cases}q_j&s\\q_j/\varepsilon_j&p\end{cases}\end{gathered}

The scalar amplitude is transverse electric field for s polarization and impedance-normalized transverse magnetic field for p polarization. The normal square root decays into passive outgoing media. Multiple reflections inside the finite film determine the dip; no prescribed resonance line is added. Angles are internal and measured from the interface normal.

Absorption from the electric field

FE=∣E(d+)∣2∣Einc∣2a(z)=k0Im⁡εm ∣E(z)∣2npcos⁡θ ∣Einc∣2A=∫0da(z) dz\begin{gathered}F_E=\frac{|\mathbf E(d^+)|^2}{|E_{\rm inc}|^2}\\a(z)=\frac{k_0\operatorname{Im}\varepsilon_m\,|\mathbf E(z)|^2}{n_p\cos\theta\,|E_{\rm inc}|^2}\\A=\int_0^d a(z)\,\mathrm dz\end{gathered}

The enhancement is evaluated on the sample side of the film. Local Joule loss integrates to the same absorption obtained by subtracting reflected and transmitted normal Poynting power. A discontinuous normal electric field at a material boundary does not imply discontinuous normal displacement.

An isolated-interface reference

βsp=k0εmεaεm+εaℓI,z=12Im⁡kza\begin{gathered}\beta_{\rm sp}=k_0\sqrt{\frac{\varepsilon_m\varepsilon_a}{\varepsilon_m+\varepsilon_a}}\\\ell_{I,z}=\frac1{2\operatorname{Im}k_{za}}\end{gathered}

The isolated-interface mode explains why changing sample index shifts momentum matching. It does not locate the exact finite-film reflection minimum. The displayed dip is found in the computed angular scan. The normal decay length belongs to intensity; field amplitude has twice this decay length. It is undefined as a decay length when the outgoing field propagates.

Common difficulties

Does a dark reflection prove molecular binding?

Typical misconceptionAny reflection dip uniquely identifies molecules on the metal.

Better mental modelA dip depends on angle, film properties, polarization and the surrounding dielectric. Molecular sensing requires a surface-binding model and calibration. Here only a uniform sample refractive index changes; no molecule count or chemical specificity is inferred.

Run the experiment

  1. 01

    Scene 1: Dark reflection, strong surface field

    Drag the cyan source through the dark reflection angle, then compare with the off-resonance preset.

    What to observe: Near resonance the reflected collector dims and the sample-side electric vectors grow.
  2. 02

    Scene 2: Away from resonance

    Increase the analyte index and click the shifted gold dip in the scan to select its new angle.

    What to observe: A higher sample index shifts the accessible p-polarized dip toward larger internal angles. A dip outside the scan is not reported.
  3. 03

    Scene 3: Change to s polarization

    Choose s polarization, change the actual film thickness, then inspect depth profiles and download the complex field.

    What to observe: With s polarization the normal electric component vanishes. Zero loss removes absorption, and zero thickness removes the film entirely.
FeedbackSomething broken, confusing, or missing on this page?Tell us
What kind of feedback?

Sent with this page’s address, its Lab ID, the site language and your device type. Please leave out personal details. Feedback is kept for up to 12 months.Privacy policy