Direct and zero-loss fractions
Elastic and inelastic events are independent in this teaching model.
E26 · Electron imaging / spectroscopy
Why does a denser inclusion look dark in bright-field TEM? It scatters more electrons to large angles, and the objective aperture blocks those electrons from the bright-field image. Open a wider aperture and some of the scattered electrons get back in, weakening this mass-thickness contrast.
Pass a parallel beam through an amorphous wedge with denser inclusions. Open the objective aperture, select zero-loss electrons and defocus the image. Follow the direct, scattered and excluded electrons all the way to the recorded image.
Physics tutorial
BackgroundPass a parallel beam through an amorphous wedge with denser inclusions. Open the objective aperture, select zero-loss electrons and defocus the image. Follow the direct, scattered and excluded electrons all the way to the recorded image.
Why it mattersBefore drawing conclusions about the specimen, see how each instrument setting shapes the measured result.
Start with the essentials
Elastic and inelastic events are independent in this teaching model.
The width of the diffuse part is chosen to keep the assumed mean-square scattering angle.
The rejected intensity is kept as its own fraction; no absorption is calculated.
Typical misconceptionEvery electron missing from a bright-field image was absorbed by the specimen.
Better mental modelThe model splits the incident electrons into three parts: recorded, stopped by the aperture and removed by the filter. Scattering electrons to other angles can darken the image on its own, without any absorption term.
Predict whether opening the objective aperture makes the dense inclusion brighter or darker. Compare Contrast target and Open aperture at the same specimen thickness.
What to observe: The objective aperture turns a change in scattering angle into a change in brightness. Opening it lets scattered electrons back in, which weakens the mass contrast. Zero-loss and unscattered electrons are different groups.Keep recorded intensity above 15 percent, inclusion contrast at least 15 percent, plural inelastic scattering below 30 percent, and geometric blur below 4 nm.
What to observe: Check the numbers against the target, then compare the instrument view with the data it produces.Compare the zero-loss filtered and unfiltered cases. Then thicken the specimen and defocus it. Explain lost counts, plural scattering and blur separately.
What to observe: Contrast comes from an incoherent amplitude model. The elastic and inelastic mean free paths are assumed, and the angular distribution is a direct beam plus a Gaussian spread. The zero-loss filter removes every electron that has lost energy. Defocus only blurs the image geometrically; Fresnel phase contrast, diffraction, multislice and dynamical scattering are not modeled. The mean free paths are illustrative, not tabulated material data.