Uniform-depth escape
Depth-average Beer–Lambert survival toward a collector above the flat foil.
E33 · X-ray microanalysis
Scan a thin synthetic foil with a vanadium-rich nanodomain. Store a photon-energy spectrum at every probe position. Extract region spectra and line profiles from the acquired cube, then compare raw windows with a response-corrected composition estimate.
Physics tutorial
BackgroundScan a thin synthetic foil with a vanadium-rich nanodomain. Store a photon-energy spectrum at every probe position. Extract region spectra and line profiles from the acquired cube, then compare raw windows with a response-corrected composition estimate.
Why it mattersTarget: isolate the nanodomain interior with an absorption-corrected fit. Keep thickness at or below 60 nm, probe FWHM at or below 2 nm and total drift at or below 1 nm. Obtain more than 2,000 region counts, error below 0.04 and a fitted vanadium fraction within 0.05 of 0.55.
Start with the essentials
Depth-average Beer–Lambert survival toward a collector above the flat foil.
Response columns may include the supplied absorption correction. This does not invert probe spreading.
Incident electrons per scan-pixel area; dose does not quantify damage in this Lab.
Typical misconceptionA bright energy window is an element concentration map.
Better mental modelA chemical map combines probe spreading, spectral overlap, self-absorption and counting precision. Reprocessing stored counts changes interpretation, but does not acquire more photons or reverse spatial mixing.
Compare the thin and thick presets without changing the nanodomain reference.
What to observe: More thickness creates more photons but broadens the count-derived boundary.Toggle absorption correction and move the selected region.
What to observe: The recorded cube is unchanged. Spectra and composition estimates are recomputed from the same pixels.Try low counts, a broad probe and drift. Check the target in a thin, stationary foil.
What to observe: A small counting error cannot certify a spatially mixed or drifted measurement.