Free flight and a thin lens
The coordinates are paraxial and measured in the Larmor frame. A real magnetic lens also rotates the beam.
E03 · Electron microscopy / foundations
Can you focus an electron probe to a small spot and still keep enough current? Yes, if you treat the optics above and below the specimen as separate jobs. The condenser lens, aperture and objective lens set how small the probe is and how much current it carries. The projector lens sits after the specimen, so adjusting it and the screen only changes how much of that current the screen catches. The specimen stays in focus.
Drag the condenser, aperture, objective and projector along the column and tune their focal lengths. Follow the rays from a finite source: the aperture stops some, and the rest pass through the sample to the screen. Focus a probe smaller than 100 nm at the sample while keeping at least 20 pA. Then adjust the projector and screen width so the screen catches at least 90 percent of that current, without refocusing the specimen.
Physics tutorial
BackgroundDrag the condenser, aperture, objective and projector along the column and tune their focal lengths. Follow the rays from a finite source: the aperture stops some, and the rest pass through the sample to the screen. Focus a probe smaller than 100 nm at the sample while keeping at least 20 pA, then see how the projector changes the screen image without refocusing the specimen.
Why it mattersBefore you trust an electron image, you need to know what the source, the lens column and the specimen itself allow.
Start with the essentials
The coordinates are paraxial and measured in the Larmor frame. A real magnetic lens also rotates the beam.
The rays sample a uniform spread of source positions and angles at fixed points, so the current curve changes in discrete steps.
This diameter is a teaching estimate, not the profile of a coherently propagated spot.
Every ray carries the same current, and each bin adds up the rays that land in it. The probe current splits into the part the screen catches and the part that misses it. The histogram has no count noise, diffraction propagation or detector response.
A smaller convergence angle tolerates more focus error along the axis, but it can increase diffraction.
Typical misconceptionA larger screen image means a better sample resolution.
Better mental modelThe projector only changes the scale on the screen. How much detail you get from the sample is set by the probe and by how it interacts with the specimen.
Select the defocused preset and predict a focal length. Then tune the objective until the profile at the sample plane narrows.
What to observe: The sample focus depends on the source and both upstream lenses.Close down the aperture while watching current and diffraction. Aim for a probe of at most 100 nm carrying at least 20 pA, then press Check target.
What to observe: Rays can cross at a sharp geometric focus and still carry too little current or be limited by diffraction.Select the clipped-projection preset. Leave the upstream optics alone, and adjust the projector or widen the screen until it catches at least 90 percent of the probe current.
What to observe: The full width of the projected rays changes, but the probe at the sample stays the same. Narrow the active screen and the caught current falls, while the full projected width does not change. The screen histogram is not renormalized, so current that misses the screen simply does not appear.